About this scholarly article

2011 IEEE International Integrated Reliability Workshop Final Report - Impact of STI stress on hot carrier degradation in 5V NMOSFET by Jiang, Hao; Yap, Hin Kiong; Pandey, Shesh Mani; Park, Jae Soo; Lim, James; Zeng, Xu is a scholarly article available to read on EtoBox.

Author

Jiang, Hao; Yap, Hin Kiong; Pandey, Shesh Mani; Park, Jae Soo; Lim, James; Zeng, Xu

Publisher

IEEE

Published

2011

Language

EN