About this scholarly article

2008 IEEE International Integrated Reliability Workshop Final Report - Positive Bias Temperature Instability Effects in advanced High-k by Ioannou, Dimitris P.; Mittl, Steve; LaRosa, Giuseppe is a scholarly article available to read on EtoBox.

Author

Ioannou, Dimitris P.; Mittl, Steve; LaRosa, Giuseppe

Publisher

IEEE

Published

2008