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About this Engineering article
Fatigue crack growth down low energy interfaces in copper doped with bismuth. (Dissertation): Chikwembani, S.Diss. Abstr. Int. Apr. 1988, 48, is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0142-1123)
- Published
- 1989
- Language
- EN
- Field
- Engineering (Physical Sciences)