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A Large-Scale Study of Flash Memory Failures in the Field by Justin Meza; Qiang Wu; Sanjev Kumar; Onur Mutlu is a Computer Science article available to read on EtoBox.

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Servers use flash memory based solid state drives (SSDs) as a high-performance alternative to hard disk drives to store persistent data. Unfortunately, recent increases in flash density have also brought about decreases in chip-level reliability. In a data center environment, flash-based SSD failures can lead to downtime and, in the worst case, data loss. As a result, it is important to understand flash memory reliability characteristics over flash lifetime in a realistic production data center environment running modern applications and system software. This paper presents the first large-scale study of flash-based SSD reliability in the field. We analyze data collected across a majority of flash-based solid state drives at Facebook data centers over nearly four years and many millions of operational hours in order to understand failure properties and trends of flash-based SSDs. Our study considers a variety of SSD characteristics, including: the amount of data written to and read from flash chips; how data is mapped within the SSD address space; the amount of data copied, erased, and discarded by the flash controller; and flash board temperature and bus power. Based on our field

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Author

Justin Meza; Qiang Wu; Sanjev Kumar; Onur Mutlu

Publisher

ACM

Published

2015

Language

EN

Field

Computer Science (Physical Sciences)