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What is Analog and Mixed-Signal Testing Techniques about?

This document discusses analog and mixed-signal test techniques. It provides an overview of integrated test techniques, which are grouped into design-for-test (DFT) and built-in self-test (BIST). DFT techniques facilitate test access and reconfigure circuits to enhance testability. BIST techniques embed test stimulus generators and response analyzers or sensors on-chip to enable low-cost testing. The goal of these alternative techniques is to reduce testing costs compared to standard specification-based tes

Author

Shankar

Language

EN