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About this Engineering article
Improvement in the bias stability of amorphous InGaZnO TFTs using an Al2O3 passivation layer by Huang, Sheng-Yao; Chang, Ting-Chang; Chen, Min-Chen; Chen, Te-Chih; Jian, Fu-Yen; Chen, Yu-Chun; Huang, Hui-Chun; Gan, Der-Shin is a Engineering article available to read on EtoBox.
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- Author
- Huang, Sheng-Yao; Chang, Ting-Chang; Chen, Min-Chen; Chen, Te-Chih; Jian, Fu-Yen; Chen, Yu-Chun; Huang, Hui-Chun; Gan, Der-Shin
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0257-8972)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)