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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VIII - Nanoscale precision in ion milling for optical and terahertz antennas by von Freymann, Georg; Schoenfeld, Winston V.; Rumpf, Raymond C.; Helvajian, Henry; Seniutinas, G.; Gervinskas, G.; Balčytis, A.; Clark, F.; Nishijima, Y.; Krotkus, A.; Molis, G.; Valušis, G.; Juodkazis, S. is a scholarly article available to read on EtoBox.

Author
von Freymann, Georg; Schoenfeld, Winston V.; Rumpf, Raymond C.; Helvajian, Henry; Seniutinas, G.; Gervinskas, G.; Balčytis, A.; Clark, F.; Nishijima, Y.; Krotkus, A.; Molis, G.; Valušis, G.; Juodkazis, S.
Publisher
SPIE
Published
2015
Language
EN

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