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About this Physics and Astronomy article
Valence-band characterization of InGaAs/GaAs AND GaAs/GaAsP strained-layer structures by E.D. Jones; R.M. Biefeld; J.F. Klem; S.K. Lyo; G.C. Osbourn is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- E.D. Jones; R.M. Biefeld; J.F. Klem; S.K. Lyo; G.C. Osbourn
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0039-6028)
- Published
- 1990
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)
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