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About this Engineering article
Characterization of defect levels in chemically deposited CdS films in the cubic-to-hexagonal phase transition by Vigil, O. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Vigil, O.
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-2101)
- Published
- 1997
- Language
- EN
- Field
- Engineering (Physical Sciences)