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This document discusses the importance of aging-aware design in analog integrated circuits, focusing on how aging affects their reliability and performance over time. It highlights the need for a systematic approach to account for various aging effects, particularly operating point-dependent degradation (OPDD), across standard analog blocks. The research emphasizes that existing methods are insufficient and proposes a combination of circuit architectural changes and degradation models to improve the reliabi

Author

mosuribalaji

Language

EN