About this scholarly article

2008 9th International Conference on Ultimate Integration of Silicon - A generalised methodology for oxide leakage current metric by Engstrom, O.; Piscator, J.; Raeissi, B.; Hurley, P. K.; Cherkaoui, K.; Hall, S.; Lemme, M. C.; Gottlob, H. D. B. is a scholarly article available to read on EtoBox.

Author

Engstrom, O.; Piscator, J.; Raeissi, B.; Hurley, P. K.; Cherkaoui, K.; Hall, S.; Lemme, M. C.; Gottlob, H. D. B.

Publisher

IEEE

Published

2008