About this scholarly article

SPIE Proceedings [SPIE SIOEL: Sixth Symposium of Optoelectronics - Bucharest, Romania (Wednesday 22 September 1999)] SIOEL '99: Sixth Symposium on Optoelectronics - Digital speckle-interferometry camera for nondestructive testing by Apostol, Dan; Damian, Victor S.; Dobroiu, Adrian; Nascov, Victor; Necsoiu, Teodor; Robu, Maria; Dumitras, Dan C. is a scholarly article available to read on EtoBox.

Author

Apostol, Dan; Damian, Victor S.; Dobroiu, Adrian; Nascov, Victor; Necsoiu, Teodor; Robu, Maria; Dumitras, Dan C.

Publisher

SPIE

Published

2000