Can I read Enhancing Memristor Fundamentals Through Instrumental Characterization and Understanding Reliability Issues on EtoBox?
Enhancing Memristor Fundamentals Through Instrumental Characterization and Understanding Reliability Issues by Fei Qin; Yuxuan Zhang; Han Wook Song; Sunghwan Lee is a Engineering article available to read on EtoBox.
What is Enhancing Memristor Fundamentals Through Instrumental Characterization and Understanding Reliability Issues about?
A memristor is a promising synaptic device for neuromorphic computing. This review article encompasses various instrumental characterization methods which enhance a fundamental understanding of the switching and reliability mechanisms of memristors.
Who reads Enhancing Memristor Fundamentals Through Instrumental Characterization and Understanding Reliability Issues?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Fei Qin; Yuxuan Zhang; Han Wook Song; Sunghwan Lee
- Publisher
- Royal Society of Chemistry (RSC)
- Published
- 2023
- Language
- EN
- Field
- Engineering (Physical Sciences)