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About this Materials Science article

Electron microscopy investigation of defects in SiC by Pirouz, P. is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Pirouz, P.
Publisher
International Union of Crystallography; International Union of Crystallography (IUCr) (ISSN 0108-7673)
Published
1996
Field
Materials Science (Physical Sciences)