About this scholarly article

1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Flicker noise characterization of polysilicon resistors in submicron BiCMOS technologies by Roux dit Buisson, O.; Morin, G. is a scholarly article available to read on EtoBox.

Author

Roux dit Buisson, O.; Morin, G.

Publisher

IEEE

Published

1997