About this scholarly article

2017 IEEE International Electron Devices Meeting (IEDM) - Industrialised SPAD in 40 nm technology by Pellegrini, S.; Rae, B.; Pingault, A.; Golanski, D.; Jouan, S.; Lapeyre, C.; Mamdy, B. is a scholarly article available to read on EtoBox.

Author

Pellegrini, S.; Rae, B.; Pingault, A.; Golanski, D.; Jouan, S.; Lapeyre, C.; Mamdy, B.

Publisher

IEEE

Published

2017