About this scholarly article

2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Thermal analysis of AlGaN/GaN High-Electron-Mobility Transistors by Infrared Microscopy by Zhao, Miao; Liu, Xinyu; Yingkui, Zheng; Wei, Ke; Mingzeng, Peng; Yankui, Li; Guoguo, Liu is a scholarly article available to read on EtoBox.

Author

Zhao, Miao; Liu, Xinyu; Yingkui, Zheng; Wei, Ke; Mingzeng, Peng; Yankui, Li; Guoguo, Liu

Publisher

IEEE

Published

2012

Language

EN