About this scholarly article

Retention Time Measurements and Modelling of Bit Error Rates of WIDE I/O DRAM in MPSoCs by Weis, Christian; Jung, Matthias; Ehses, Peter; Santos, Cristiano; Vivet, Pascal; Goossens, Sven; Koedam, Martijn; Wehn, Norbert is a scholarly article available to read on EtoBox.

Author

Weis, Christian; Jung, Matthias; Ehses, Peter; Santos, Cristiano; Vivet, Pascal; Goossens, Sven; Koedam, Martijn; Wehn, Norbert

Publisher

IEEE Conference Publications

Published

2015