About this scholarly article

13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Dynamic Optical Techniques for IC Debug and Failure Analysis by Ferrigno, Julie; Desplats, Romain; Perdu, Philippe; Sanchez, Kevin; Beaudoin, Felix; Lewis, Dean is a scholarly article available to read on EtoBox.

Author

Ferrigno, Julie; Desplats, Romain; Perdu, Philippe; Sanchez, Kevin; Beaudoin, Felix; Lewis, Dean

Publisher

IEEE

Published

2006

Language

EN