About this scholarly article

2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479) - Quantifying a simple antenna design rule by Gabriel, C.T.; de Muizon, E. is a scholarly article available to read on EtoBox.

Author

Gabriel, C.T.; de Muizon, E.

Publisher

American Vacuum Soc

Published

2000

Language

EN