About this scholarly article

SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco Airport, California, USA (Sunday 23 January 2011)] Visualization and Data Analysis 2011 - Visual pattern discovery in timed event data by Schaefer, Matthias; Wanner, Franz; Mansmann, Florian; Scheible, Christian; Stennett, Verity; Hasselrot, Anders T.; Keim, Daniel A. is a scholarly article available to read on EtoBox.

Author

Schaefer, Matthias; Wanner, Franz; Mansmann, Florian; Scheible, Christian; Stennett, Verity; Hasselrot, Anders T.; Keim, Daniel A.

Publisher

SPIE

Published

2011

Language

EN