About this scholarly article

AIP Conference Proceedings [AIP THE 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY - Chicago, Illinois, (USA) (15–20 August 2010)] - The Best of Both Worlds: 3D X-ray Microscopy with Ultra-high Resolution and a Large Field of View by Li, W.; Gelb, J.; Yang, Y.; Guan, Y.; Wu, W.; Chen, J.; Tian, Y.; McNulty, Ian; Eyberger, Catherine; Lai, Barry is a scholarly article available to read on EtoBox.

Author

Li, W.; Gelb, J.; Yang, Y.; Guan, Y.; Wu, W.; Chen, J.; Tian, Y.; McNulty, Ian; Eyberger, Catherine; Lai, Barry

Publisher

AIP

Published

2011