About this scholarly article

Reliability of amorphous InGaZnO thin film transistors passivated by polysilsesquioxane-based passivation layer by Bermundo, Juan Paolo (author);Ishikawa, Yasuaki (author);Yamazaki, Haruka (author);Nonaka, Toshiaki (author);Uraoka, Yukiharu (author) is a scholarly article available to read on EtoBox.

Author

Bermundo, Juan Paolo (author);Ishikawa, Yasuaki (author);Yamazaki, Haruka (author);Nonaka, Toshiaki (author);Uraoka, Yukiharu (author)

Published

2013