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About this Materials Science article
Thin Dielectric Film Thickness Determination by Advanced Transmission Electron Microscopy by Diebold, A.C.; Foran, B.; Kisielowski, C.; Muller, D.A.; Pennycook, S.J.; Principe, E.; Stemmer, S. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Diebold, A.C.; Foran, B.; Kisielowski, C.; Muller, D.A.; Pennycook, S.J.; Principe, E.; Stemmer, S.
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2003
- Language
- EN
- Field
- Materials Science (Physical Sciences)