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About this Physics and Astronomy article
Roughness Analysis in Strained Silicon-on-insulator Wires and Films by Ureña, Ferran; Olsen, Sarah H.; Escobedo-Cousin, Enrique; Minamisawa, Renato A.; Raskin, Jean-Pierre is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Ureña, Ferran; Olsen, Sarah H.; Escobedo-Cousin, Enrique; Minamisawa, Renato A.; Raskin, Jean-Pierre
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 2014
- Field
- Physics and Astronomy (Physical Sciences)