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About this Materials Science article
Ga+ FIB Milling and Measurement of FIB Damage in Sapphire by Van Leer, Brandon; Cheng, Huikai; Riesterer, Jessica is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Van Leer, Brandon; Cheng, Huikai; Riesterer, Jessica
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2014
- Field
- Materials Science (Physical Sciences)
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