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Book Reviews - Quantitative X-Ray Diffractometry, L. S. Zevin and G. Kimmel, Springer-Verlag, New York1995, ISBN 0-387-94541-5, 372+XVII pp. by Fiala, Jaroslav is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Fiala, Jaroslav
Publisher
International Centre for Diffraction Data; Cambridge University Press; Cambridge University Press (CUP) (ISSN 0885-7156)
Published
1996
Field
Materials Science (Physical Sciences)

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