About this scholarly article

2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Timing yield optimization via discrete gate sizing using globally-informed delay PDFs by Dutt, Shantanu; Ren, Huan is a scholarly article available to read on EtoBox.

Author

Dutt, Shantanu; Ren, Huan

Publisher

IEEE

Published

2010

Language

EN