About this scholarly article

SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2007 - San Jose, CA (Saturday 20 January 2007)] Optical Components and Materials IV - Simple chromatic dispersion measurement method using a spectral interferometer by Lee, J. Y.; Jiang, Shibin; Digonnet, Michel J. F.; Shin, I. H.; Lee, S. R.; Wei, Tau.; Kim, D. Y. is a scholarly article available to read on EtoBox.

Author

Lee, J. Y.; Jiang, Shibin; Digonnet, Michel J. F.; Shin, I. H.; Lee, S. R.; Wei, Tau.; Kim, D. Y.

Publisher

SPIE

Published

2007