About this scholarly article

26th IEEE VLSI Test Symposium (vts 2008) - Expanding Trace Buffer Observation Window for In-System Silicon Debug through Selective Capture by Yang, Joon-Sung; Touba, Nur A. is a scholarly article available to read on EtoBox.

Author

Yang, Joon-Sung; Touba, Nur A.

Publisher

IEEE

Published

2008