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About this Engineering article
Density functional theory based analysis of the origin of traps at the InAs/Si hetero-interface by Sant, S.; Luisier, M.; Schenk, A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sant, S.; Luisier, M.; Schenk, A.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2017
- Field
- Engineering (Physical Sciences)