About this scholarly article

SPIE Proceedings [SPIE Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - St. Petersburg, Russia (Monday 7 June 1999)] Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - Resonance photodetachment of Sn negative ion by Ivanov, Vadim K.; Kashenock, Galina Y.; Lapkin, Constantin V.; Melker, Alexander I. is a scholarly article available to read on EtoBox.

Author

Ivanov, Vadim K.; Kashenock, Galina Y.; Lapkin, Constantin V.; Melker, Alexander I.

Publisher

SPIE

Published

2000

Language

EN