About this Engineering article
Noise performance at cryogenic temperatures at AlGaAs/InGaAs HEMT's with 0.15-μm T-shaped WSix gates by Joshin, K.; Mimino, Y.; Ohmura, S.; Hirachi, Y. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Joshin, K.; Mimino, Y.; Ohmura, S.; Hirachi, Y.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1992
- Language
- EN
- Field
- Engineering (Physical Sciences)