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The document discusses data collection and processing in x-ray crystallography. It explains how to select and mount a crystal, collect diffraction data using an x-ray source, and process the data through corrections to determine cell parameters and an absorption model. Safety considerations for working with x-ray equipment are also outlined. The goal of data collection is to obtain high quality data up to a maximum resolution of 0.54 Å to resolve atomic-scale structural features. Maintaining a properly alig

Author

ZSk4

Language

EN