About this scholarly article

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) - From design-for-test to design-for-debug-and-test: analysis of requirements and limitations for 1149.1 by Alves, G.R.; Ferreira, J.M.M. is a scholarly article available to read on EtoBox.

Author

Alves, G.R.; Ferreira, J.M.M.

Publisher

IEEE Comput. Soc

Published

1999

Language

EN