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About this Engineering article
Atomic Force Microscopy Investigation of Buckling Patterns of Nickel Thin Films on Polycarbonate Substrates by Cleymand, F.; Coupeau, C.; Grilhé, J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Cleymand, F.; Coupeau, C.; Grilhé, J.
- Publisher
- Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 0950-0839)
- Published
- 2002
- Language
- EN
- Field
- Engineering (Physical Sciences)