About this scholarly article

Proceedings Design, Automation and Test in Europe - Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restoration by Guo, R.; Pomeranz, I.; Reddy, S.M. is a scholarly article available to read on EtoBox.

Author

Guo, R.; Pomeranz, I.; Reddy, S.M.

Publisher

IEEE Comput. Soc

Published

1998