About this scholarly article

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 - A process and technology-tolerant I/sub DDQ/ method for IC diagnosis by Patel, C.; Plusquellic, J. is a scholarly article available to read on EtoBox.

Author

Patel, C.; Plusquellic, J.

Publisher

IEEE Comput. Soc

Published

2001