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About this Engineering article

Inhomogeneity of the deep center el2 in GaAs observed by direct infra-red imaging by M. S. Skolnickf; M. R. Brozel; L. J. Reed; I. Grant; D. J. Stirland; R. M. Ware is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
M. S. Skolnickf; M. R. Brozel; L. J. Reed; I. Grant; D. J. Stirland; R. M. Ware
Publisher
Springer US; Springer-Verlag; Springer New York LLC; Springer Science and Business Media LLC (ISSN 0361-5235)
Published
1984
Language
EN
Field
Engineering (Physical Sciences)

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