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About this Engineering article

Chemical changes in chromium silicide thin films as a result of laser trimming as determined by SAM and XPS by R. G. Masters is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
R. G. Masters
Publisher
AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-2101)
Published
1985
Language
EN
Field
Engineering (Physical Sciences)

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