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About this Materials Science article
Grain Size and Electrical Resistivity Measurements on Aluminum Polycrystalline Thin Films by Diego Chaverri; Alejandro Saenz; Victor Castano is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Diego Chaverri; Alejandro Saenz; Victor Castano
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-577X)
- Published
- 1991
- Field
- Materials Science (Physical Sciences)
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