Opening book details…
About this Physics and Astronomy article
Cavity Origin and Influence on Reliability in Lead Zirconate Titanate Thin Film Capacitors by Chentir, Mohamed-Tahar; Ventura, Laurent; Bouyssou, Émilien; Anceau, Christine is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Chentir, Mohamed-Tahar; Ventura, Laurent; Bouyssou, Émilien; Anceau, Christine
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 2009
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)