About this scholarly article

1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Controlled silicon thinning for design debug of C4 packaged ICs by Goruganthu, R.R.; Bruce, M.; Birdsley, J.; Bruce, V.; Gilfeather, G.; Ring, R.; Antoniou, N.; Salen, J.; Thompson, M. is a scholarly article available to read on EtoBox.

Author

Goruganthu, R.R.; Bruce, M.; Birdsley, J.; Bruce, V.; Gilfeather, G.; Ring, R.; Antoniou, N.; Salen, J.; Thompson, M.

Publisher

IEEE

Published

1999

Language

EN