About this scholarly article

2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Fundamental design consideration of sampling circuit by Kurihara, Keita; Kobayashi, Kensuke; Uemori, Masafumi; Arai, Miho; Kobayashi, Haruo is a scholarly article available to read on EtoBox.

Author

Kurihara, Keita; Kobayashi, Kensuke; Uemori, Masafumi; Arai, Miho; Kobayashi, Haruo

Publisher

IEEE

Published

2016

Language

EN