About this Engineering article
Ion-beam-induced charge-collection imaging of CMOS ICs by F.W. Sexton; K.M. Horn; B.L. Doyle; J.S. Laird; M. Cholewa; A. Saint; G.J.F. Legge is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- F.W. Sexton; K.M. Horn; B.L. Doyle; J.S. Laird; M. Cholewa; A. Saint; G.J.F. Legge
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0168-583X)
- Published
- 1993
- Language
- EN
- Field
- Engineering (Physical Sciences)