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Can I read Multilayer and Thin Film Analysis Using FPMulti Software on EtoBox?
Multilayer and Thin Film Analysis Using FPMulti Software by M. H. J. Bekkers; H. A. van Sprang is a Physics and Astronomy article available to read on EtoBox.
What is Multilayer and Thin Film Analysis Using FPMulti Software about?
X-ray spectrometry combined with a fundamental parameter package can be used to obtain semiquantitative analytical results for thin layered samples. This paper explores the use of the program FPMulti for various applications. These applications are examples of how accurate this program is for multilayer and thin Ðlm analysis. After a short description of the analytical method, the range of applications is given with which the authors have experience. In the experimental section three applications are described in more detail : (i) an example to show the accuracy of the method, (ii) an example of the calculation of the layer thickness and (iii) the possibility of quantifying oxygen in 3d metal oxides.
Who reads Multilayer and Thin Film Analysis Using FPMulti Software?
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- M. H. J. Bekkers; H. A. van Sprang
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0049-8246)
- Published
- 1997
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)