Opening book details…
About this Engineering article
Analysis strategy for internal measurements on VLSI devices by Jochen Kölzer; Focko Frieling; David Cutter is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jochen Kölzer; Focko Frieling; David Cutter
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-9317)
- Published
- 1987
- Field
- Engineering (Physical Sciences)
More by Jochen Kölzer; Focko Frieling; David Cutter
Browse all works by Jochen Kölzer; Focko Frieling; David Cutter