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Changes in particle area measurements due to SEM accelerating voltage and magnification by María Julia Yañez; Silvia Elena Barbosa is a Biochemistry, Genetics and Molecular Biology article available to read on EtoBox.

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## Abstract Scanning electron microscopy (SEM) images of polymer blends followed by digital image analysis is a rapid and easy method for the measurement of particle size and dispersion. The particle size determination is done with appropriate off‐line image analysis software. However, it is necessary to understand how machine parameters involved in the formation of the SEM image influence area measurements of morphological features. In this work, the influence of the accelerating voltage used during image acquisition was examined with standard samples and with polymer blend samples. A systematic study centered on two mutually exclusive assumptions of area variation or no area variation with accelerating voltage was carried out. The off‐line image analysis software was then calibrated according to the assumptions. The main conclusion of this study was that kV has an important influence on area measurement in SEM images. This effect was observed for different standard materials (metallic and polymeric) and for the range of magnifications used. The higher the accelerating voltages, the greater the error at high magnification for polymer samples. As the beam energy increases, the prim

Who reads Changes in particle area measurements due to SEM accelerating voltage and magnification?

Author

María Julia Yañez; Silvia Elena Barbosa

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 1059-910X)

Published

2003

Language

EN

Field

Biochemistry, Genetics and Molecular Biology (Life Sciences)