About this scholarly article

SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Learning algorithms for both real-time detection of solder shorts and for SPC measurement correction using cross-sectional x-ray images of PCBA solder joints by Roder, Paul A.; Dawson, Benjamin M.; Wilson, Stephen S.; Wu, Frederick Y. is a scholarly article available to read on EtoBox.

Author

Roder, Paul A.; Dawson, Benjamin M.; Wilson, Stephen S.; Wu, Frederick Y.

Publisher

SPIE

Published

1994