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About this Engineering article
Photoreflectance Characterization of Ordered/Disordered GaAs 0.5 Sb 0.5 layers Grown on InP Substrates by Molecular Beam Epitaxy by Kawamura, Yuichi; Amano, Masanobu; Ouchi, Koichi; Inoue, Naohisa is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kawamura, Yuichi; Amano, Masanobu; Ouchi, Koichi; Inoue, Naohisa
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2003
- Language
- EN
- Field
- Engineering (Physical Sciences)
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